Parallel test is a surefire method for speeding up production, and asynchronous parallel test has long been known as an effective way of significantly improving through-put while making the most of ...

An introduction to analysing quantitative data including topics such as, understanding the distribution of data variables, and parametric and non-parametric statistical tests.

Today’s devices are required to pass thousands of parametric tests prior to being shipped to customers. A key challenge test engineers face, in addition to optimizing the number of tests they run on ...

October 22, 2012. Keithley Instruments Inc. has introduced seven instrumentation, software, and test-fixture configurations for parametric curve-tracing applications for characterizing high-power ...

The test is also shown to have power against any local alternatives approaching the null at rates slower than the parametric rate n-1/2. The finite sample performance of the test is evaluated via a ...

January 23, 2014. Keithley Instruments Inc. has introduced the latest upgrades to its S530 Parametric Test Systems for high-speed production parametric test of semiconductors. These enhancements ...

A distribution-free two-sample test is proposed that is an extension of the Wilcoxon test to samples with arbitrary censoring on the right. The test is conditional on the pattern of observations.