Researchers say that using artificial-intelligence tools to visualize scientific images can become problematic when models ...

Every year, wind and other abiotic forces cause herbaceous crop stems to buckle and snap, a phenomenon known as lodging that ...

Researchers from the Physical Chemistry and Theory departments at the Fritz Haber Institute have found a new way to image layers of boron nitride that are only a single atom thick. This material is ...

Atomic force microscopy, or AFM, is a widely used technique that can quantitatively map material surfaces in three dimensions, but its accuracy is limited by the size of the microscope's probe. A new ...

A hybrid microscope allows scientists to simultaneously image the full 3D orientation and position of an ensemble of molecules, such as labeled proteins inside cells. The microscope combines polarized ...

A new electron microscope has been developed that can take images of materials at angstrom-scale (one-tenth of a nanometer) resolution, about the size of a single hydrogen atom. Images will be ...

The instrument, which operates near absolute zero for hours, will soon ship to a few labs. Researchers are thrilled.

As per SNS Insider, the Global Automated Microscopy Market is projected to reach USD 16.63 billion by 2035, growing at a 7.35 ...

From grains of pollen to insects less than a millimeter long, scientists get incredible views of the world by looking through a microscope. And as researchers conduct their studies, sometimes they ...

Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.

Current genetic sequencing techniques can provide much information about the genetic makeup and activity in a sample, like a piece of tissue or a drop of blood. But they are unable to reveal where ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...